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  4. Delta-sigma loop based on charge pumping in SOI optical sensor
 
conference paper

Delta-sigma loop based on charge pumping in SOI optical sensor

Harik, L.
•
Sallese, Jean-Michel  
•
Kayal, M.  
2008
Proceedings of IEEE Sensors

In this paper, the partially depleted SOI phototransistor has been used as a light intensity sensor. A pixel implementing the technique elaborated in [1] was designed and implemented on SOI technology. The circuit implements a first order delta-sigma modulator. Measured data show flux densities as low as 3mW/m2 and an SNR of 60 dB. © 2008 IEEE.

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Type
conference paper
DOI
10.1109/ICSENS.2008.4716704
Scopus ID

2-s2.0-67649921566

Author(s)
Harik, L.
Sallese, Jean-Michel  
Kayal, M.  
Date Issued

2008

Published in
Proceedings of IEEE Sensors
Start page

1382

End page

1385

Note

Electrical Engineering, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland

Export Date: 19 January 2010

Source: Scopus

Art. No.: 4716704

References: Harik, L., Sallese, J.-M., Kayal, M., Transient charge pumping as an efficient technique to measure low light intensity with PD SOI MOSFET (2008) Solid-State Electronics, 52, pp. 597-605; Hill, J.M., Lachman, J., A 900 MHz 2.25 MB cache with on chip CPU now in CU SOI (2001) ISSCC, , Session 11 SRAM 11.5; Okhonin, S., Nagoga, M., Fazan, P., Principles of transient charge pumping on partially depleted SOI MOSFETs (2002) IEEE Electron Device Letters, 23 (5), pp. 279-281. , DOI 10.1109/55.998876, PII S0741310602045330; Candsy, J.C., Themes, G.C., (1992) Oversampling Delta-Sigma Data Converters, , IEEE Press; Sallese, J.-M., Bucher, M., Krummenacher, F., Fazan, P., Inversion charge linearization in MOSFET modeling and rigorous derivation of the EKV compact model (2003) Solid-State Electronics, 47, pp. 677-683

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Available on Infoscience
October 21, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/55911
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