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  4. Interferometric study on Gouy phase anomaly of microlens array
 
conference paper

Interferometric study on Gouy phase anomaly of microlens array

Kim, Myun-Sik  
•
Scharf, Toralf  
•
Noell, Wilfried
Show more
Bjelkhagen, Hi
•
Bove, Vm
2015
Practical Holography Xxix: Materials And Applications
Conference on Practical Holography XXIX - Materials and Applications

We investigate the Gouy phase anomaly of light in the focus of refractive plano-convex microlens arrays by using longitudinal-differential (LD) interferometry and a finite-difference time-domain (FDTD) simulation. We put emphasis on determining the amount of the Gouy phase shift for the line focus of the cylindrical lens and the point focus of the spherical lens. We discuss additional phase structures caused by diffraction, which lead to the discrepancy from the conventional Gouy phase shift.

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Type
conference paper
DOI
10.1117/12.2182201
Web of Science ID

WOS:000354615000031

Author(s)
Kim, Myun-Sik  
Scharf, Toralf  
Noell, Wilfried
Herzig, Hans Peter  
Voelkel, Reinhard
Editors
Bjelkhagen, Hi
•
Bove, Vm
Date Issued

2015

Publisher

Spie-Int Soc Optical Engineering

Publisher place

Bellingham

Published in
Practical Holography Xxix: Materials And Applications
ISBN of the book

978-1-62841-476-9

Total of pages

6

Series title/Series vol.

Proceedings of SPIE

Volume

9386

Start page

93860Z

Subjects

Phase anomaly

•

Gouy phase shift

•

Micro-optics

•

refractive microlens array

•

interferometry

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
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Event nameEvent placeEvent date
Conference on Practical Holography XXIX - Materials and Applications

San Francisco, CA

FEB 08-11, 2015

Available on Infoscience
September 28, 2015
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/119184
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