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  4. Arsenic related defect states resonant with the semiconductor conduction band at the In0.53Ga0.47As/oxide interface: A density functional study
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research article

Arsenic related defect states resonant with the semiconductor conduction band at the In0.53Ga0.47As/oxide interface: A density functional study

Colleoni, Davide  
•
Miceli, Giacomo  
•
Pasquarello, Alfredo  
2015
Microelectronic Engineering

An arsenic related defect at the In0.53Ga0.47As/oxide interface is studied through density functional theory. This defect corresponds to an As-As timer which transforms into two doubly occupied As dangling bonds upon capture of two electrons. The defect charge transition level is found to be resonant with the bottom of the In0.53Ga0.47As conduction band and weakly sensitive to its local chemical environment. Hence, this defect is a possible candidate for the observed defect density in the conduction band of In0.53Ga0.47As. (C) 2015 Elsevier B.V. All rights reserved.

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Type
research article
DOI
10.1016/j.mee.2015.04.117
Web of Science ID

WOS:000362308000062

Author(s)
Colleoni, Davide  
Miceli, Giacomo  
Pasquarello, Alfredo  
Date Issued

2015

Publisher

Elsevier

Published in
Microelectronic Engineering
Volume

147

Start page

260

End page

263

Subjects

InGaAs/oxide interface

•

Hybrid functional

•

As-As dimer/DB defect

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CSEA  
Available on Infoscience
December 2, 2015
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/121045
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