conference paper
Three-Dimensional Localization of Nano-Emitters with Nanometer-Level Precision
2009
OSA Technical Digest (CD) (Optical Society of America, 2009)
We show nanometer-level localization accuracy of a single quantum-dot in three dimensions by self-interference and diffraction-pattern analysis. We believe that this approach has the capacity to push optical microscopy to the molecular level.
Type
conference paper
Author(s)
Date Issued
2009
Published in
OSA Technical Digest (CD) (Optical Society of America, 2009)
Editorial or Peer reviewed
NON-REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Vancouver, CA | April 26-30, 2009 | |
Available on Infoscience
July 23, 2009
Use this identifier to reference this record