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research article

Insight into the electronic structure of semiconducting epsilon-GaSe and epsilon-InSe

Eremeev, S., V
•
Papagno, M.
•
Grimaldi, I
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August 26, 2020
Physical Review Materials

Metal monochalcogenides (MX) have recently been rediscovered as two-dimensional materials with electronic properties highly dependent on the number of layers. Although some intriguing properties appear in the few-layer regime, the carrier mobility of MX compounds increases with the number of layers, motivating the interest in multilayered heterostructures or bulk materials. By means of angle-resolved photoemission spectroscopy (ARPES) measurements and density functional theory calculations, we compare the electronic band structure of bulk epsilon-GaSe and epsilon-InSe semiconductors. We focus our attention on the top valence band of the two compounds along main symmetry directions, discussing the effect of spin-orbit coupling and contributions from post-transition-metal (Ga or In) and Se atoms. Our results show that the top valence band at Gamma point is dominated by Se p(z) states, while the main effect of Ga or In appears more deeply in binding energy, at the Brillouin zone corners, and in the conduction band. These findings explain also the experimental observation of a hole effective mass rather insensitive to the post-transition metal. Finally, by means of spin-resolved ARPES and surface band structure calculations we describe Rashba-Bychkov spin splitting of surface states in epsilon-InSe.

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Type
research article
DOI
10.1103/PhysRevMaterials.4.084603
Web of Science ID

WOS:000564804800002

Author(s)
Eremeev, S., V
Papagno, M.
Grimaldi, I
De Luca, O.
Ferrari, L.
Kundu, Asish K.
Sheverdyaeva, P. M.
Moras, P.
Avvisati, G.
Crepaldi, A.  
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Date Issued

2020-08-26

Publisher

AMER PHYSICAL SOC

Published in
Physical Review Materials
Volume

4

Issue

8

Article Number

084603

Subjects

Materials Science, Multidisciplinary

•

Materials Science

•

mobility

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSE  
LNNME  
LPRX  
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Available on Infoscience
September 17, 2020
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/171756
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