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conference paper

Cross Layer Design for the Predictive Assessment of Technology-Enabled Architectures

Niemier, M.
•
Hu, X. S.
•
Liu, L.
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January 1, 2023
2023 Design, Automation & Test In Europe Conference & Exhibition, Date
Design, Automation and Test in Europe Conference and Exhibition (DATE)

There is great interest in "end-to-end" analysis that captures how innovation at the materials, device, and/or architectural levels will impact figures of merit at the application-level. However, there are numerous combinations of devices and architectures to study, and we must establish systematic ways to accurately explore and cull a vast design space. We aim to capture how innovations at the materials/device-level may ultimately impact figures of merit associated with both existing and emerging technologies that may be employed for either logic and/or memory. We will highlight how collaborations with researchers at these levels of the design hierarchy - as well as efforts to help construct well-calibrated device models - can in-turn support architectural design space explorations that will help to identify the most promising ways to use new technologies to support application-level workloads of interest. For given compute workloads, we can then quantitatively assess the potential benefits of technology-driven architectures to identify the most promising paths forward. Because of the large number of potentially interesting device-architecture combinations, it is of the utmost importance to develop well-calibrated analytical modeling tools to more rapidly assess the potential value of a given (likely heterogeneous) solution. We highlight recent efforts and needs in this space.

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Type
conference paper
DOI
10.23919/DATE56975.2023.10136923
Web of Science ID

WOS:001027444200027

Author(s)
Niemier, M.
Hu, X. S.
Liu, L.
Sharifi, M.
O'Connor, Ian
Atienza, David  
Ansaloni, Giovanni  
Li, Can
Khan, Asif
Ralph, Daniel C.
Date Issued

2023-01-01

Publisher

IEEE

Publisher place

New York

Published in
2023 Design, Automation & Test In Europe Conference & Exhibition, Date
ISBN of the book

979-8-3503-9624-9

Series title/Series vol.

Design Automation and Test in Europe Conference and Exhibition

Subjects

Automation & Control Systems

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Computer Science, Hardware & Architecture

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Engineering, Industrial

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Computer Science

•

Engineering

•

emerging logic and memory

•

cross-layer design

•

fefets

•

rram

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design space explorations

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device modeling

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circuit modeling

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architectural modeling

•

application analysis

•

content-addressable memory

•

level performance

•

search

•

energy

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
ESL  
Event nameEvent placeEvent date
Design, Automation and Test in Europe Conference and Exhibition (DATE)

Antwerp, BELGIUM

Apr 17-19, 2023

Available on Infoscience
August 28, 2023
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/200270
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