Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. New Aspects in Volmer-Weber 3d Growth - an Xps Intensity Study Applied to Thin-Films of Au and Ce on Polypropylene
 
research article

New Aspects in Volmer-Weber 3d Growth - an Xps Intensity Study Applied to Thin-Films of Au and Ce on Polypropylene

Heuberger, M.
•
Dietler, G.  
•
Schlapbach, L.
1994
Surface Science
  • Details
  • Metrics
Type
research article
DOI
10.1016/0039-6028(94)90209-7
Author(s)
Heuberger, M.
Dietler, G.  
Schlapbach, L.
Date Issued

1994

Published in
Surface Science
Volume

314

Issue

1

Start page

13

End page

22

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPMV  
Available on Infoscience
June 20, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/9032
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés