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  4. Extended focus optical coherence microscopy and fluorescence lifetime imaging
 
conference paper

Extended focus optical coherence microscopy and fluorescence lifetime imaging

Villiger, M. L.
•
Blatter, C.  
•
Bachmann, A. H.
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Conchello, J.A.
•
Cogswell, C. J.
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2008
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV
BiOS 2008

Fourier domain Optical coherence microscopy (FDOCM) offers excellent sensitivity and high axial resolution to image the structure of biological tissue. The depth information is extracted in parallel and allows very high volume acquisition rates. The present system uses a diffractionless beam, produced with an axicon lens, to achieve high lateral resolution all while maintaining an extended depth of field (xf). The xfOCM signal reveals the spatial distribution of changes of the refractive index in the sample that scatter the incident light. To identify and validate the functionality of the observed structures can proof difficult. In this work the xfOCM setup was interfaced with a fluorescent lifetime imaging (FLIM) system, working in the Fourier domain and measuring the phase offset between the modulated excitation signal and the returned fluorescence intensity. Both the fluorescence amplitude and lifetime are retrieved. The amplitude contains important information due to the selective labeling of the tissue. The lifetime is very sensitive to the surrounding environment and varies for different fluorophores, adding further contrast. The xfOCM tomograms and FLIM images are acquired in parallel. A complementary view of the sample is obtained that helps to understand and interpret the xfOCM signal. The lifetime measurement provides further contrast to perform functional imaging on biological samples such as the rat hair follicle.

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Type
conference paper
DOI
10.1117/12.763163
Web of Science ID

WOS:000256378900016

Author(s)
Villiger, M. L.
Blatter, C.  
Bachmann, A. H.
Lasser, T.  
Leitgeb, R. A.
Editors
Conchello, J.A.
•
Cogswell, C. J.
•
Wilson, T.
•
Brown, T.G.
Date Issued

2008

Publisher

SPIE

Published in
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV
Volume

6861

Start page

68610N

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LOB  
Event nameEvent placeEvent date
BiOS 2008

San Jose, CA, USA

19-24 Jan 2008

Available on Infoscience
February 26, 2008
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/19291
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