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  4. Structural phase transition in Al-Cu-Mg-Si alloys by transmission electron microscopy study on an Al-4wt% Cu-1 wt% alloy reinforced by SiC particles
 
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research article

Structural phase transition in Al-Cu-Mg-Si alloys by transmission electron microscopy study on an Al-4wt% Cu-1 wt% alloy reinforced by SiC particles

Cayron, C.  
•
Sagalowicz, L
•
Beffort, O
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1999
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

The precipitation state of an Al-4 wt% Cu-1 wt% Mg-Ag alloy reinforced with SiC particles fabricated by squeeze casting is studied by transmission electron microscopy. As a consequence of an interfacial reaction the precipitation of the characteristic phases of the unreinforced alloy, Ω and S′, is suppressed and substituted by a new precipitation consisting of isolated nanoscaled rod-shaped precipitates and θ′ plates decorated with a further type of rod-shaped precipitates. These precipitates are the Q-Al5Cu2Mg8Si6 phase (hexagonal with a = 1.035 nm and c = 0.405 nm), and two other new phases also containing Al, Cu, Mg and Si, called QC (hexagonal with a = 0.670 nm) and QP (hexagonal with a = 0.393 nm). These three phases are based on the same latent lattice, the QP lattice. A phase transition model is proposed for these phases. It implies an ordering of the structures given by displacements of atoms from a lattice based on the common QP lattice. This approach is very promising for a better understanding of the precipitation in Al-Mg-Si-Cu alloys.

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Type
research article
DOI
10.1080/014186199251364
Web of Science ID

WOS:000083953200017

Author(s)
Cayron, C.  
•
Sagalowicz, L
•
Beffort, O
•
Buffat, PA  
Date Issued

1999

Published in
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume

79

Start page

2833

End page

2851

Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
LMTM  
Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2980
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