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research article

Integration of robust fluidic interconnects using metal to glass anodic bonding

Briand, D.  
•
Weber, P.
•
de Rooij, N. F.  
2005
Micromechanics and Microengineering

This paper reports on the encapsulation of a piezoresistive silicon/Pyrex liquid flow sensor using metal to glass anodic bonding. The bonding technique allowed integrating robust metallic microfluidic interconnects and eliminating the use of glue and O-rings. The bonding parameters of a silicon/Pyrex/metal triple stack were chosen to minimize the residual stress and to obtain a strong and liquid tight bonding interface. The silicon/Pyrex liquid flow sensor was successfully bonded to metallic plates of Kovar and Alloy 42, on which tubes were fixed and a printed circuit board (PCB) was integrated. A post-bonding annealing procedure was developed to reduce the residual bonding stress. The characteristics of the encapsulated liquid flow sensor, such as the temperature coefficient of sensitivity, fulfilled the specifications. Wafer level packaging using metal to glass anodic bonding was considered to reduce the packaging size and cost. © 2005 IOP Publishing Ltd.

  • Details
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Type
research article
DOI
10.1088/0960-1317/15/9/007
Author(s)
Briand, D.  
Weber, P.
de Rooij, N. F.  
Date Issued

2005

Published in
Micromechanics and Microengineering
Volume

15

Start page

1657

End page

1663

Note

343

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39095
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