Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. Understanding the Superlinear Onset of Tunnel-FET Output Characteristic
 
research article

Understanding the Superlinear Onset of Tunnel-FET Output Characteristic

De Michielis, Luca  
•
Lattanzio, Livio  
•
Ionescu, Adrian M.  
2012
IEEE Electron Device Letters

In this letter, we report that the source and channel Fermi-Dirac distributions in interband-tunneling-controlled transistors play a fundamental role on the modulation of the injected current. We explain the superlinear onset of the output characteristics based on the occupancy function modulation. Thus, we point out that, along with the tunneling barrier transparency, the availability of carriers and empty states, at the beginning and at the end of the tunneling path, respectively, should be always taken into account for a proper modeling of tunnel FETs.

  • Details
  • Metrics
Type
research article
DOI
10.1109/LED.2012.2212175
Web of Science ID

WOS:000310387100004

Author(s)
De Michielis, Luca  
Lattanzio, Livio  
Ionescu, Adrian M.  
Date Issued

2012

Publisher

Institute of Electrical and Electronics Engineers

Published in
IEEE Electron Device Letters
Volume

33

Issue

11

Start page

1523

End page

1525

Subjects

Band-to-band tunneling (BTBT)

•

steep swing switch

•

subthermal subthreshold swing

•

subthreshold slope

•

tunnel-FET (TFET)

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Available on Infoscience
November 13, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/86862
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés