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  4. Measuring Shape and Surfaces down to the Nanometer and Nanosecond scales by Digital Holographic Microscopy
 
conference paper

Measuring Shape and Surfaces down to the Nanometer and Nanosecond scales by Digital Holographic Microscopy

Depeursinge, Christian  
•
Bergoënd, Isabelle
•
Pavillon, Nicolas  
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2009
Proceedings of the 6th International Workshop on Advanced Optical Metrology
Fringe 2009, The 6th International Workshop on Advanced Optical Metrology
  • Details
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Type
conference paper
DOI
10.1007/978-3-642-03051-2_67
Author(s)
Depeursinge, Christian  
Bergoënd, Isabelle
Pavillon, Nicolas  
Kühn, Jonas
Colomb, Tristan  
Montfort, Frédéric  
Cuche, Etienne  
Emery, Yves
Date Issued

2009

Publisher

Springer

Published in
Proceedings of the 6th International Workshop on Advanced Optical Metrology
Start page

411

End page

415

Subjects

[MVD]

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LOA  
Event nameEvent placeEvent date
Fringe 2009, The 6th International Workshop on Advanced Optical Metrology

Nürtingen

September 14-16, 2009

Available on Infoscience
September 17, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/42694
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