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  4. Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy
 
research article

Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy

Schürmann, G.
•
Noell, W.  
•
Staufer, U.
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2001
Applied Optics
  • Details
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Type
research article
DOI
10.1364/AO.40.005040
Author(s)
Schürmann, G.
Noell, W.  
Staufer, U.
de Rooij, N. F.  
Eckert, R.
Freyland, J. M.
Heinzelmann, H.
Date Issued

2001

Published in
Applied Optics
Volume

40

Issue

28

Start page

5040

End page

5045

Note

255

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39847
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