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research article
Comment on "Structural analysis of the SiO2/Si(100) interface by means of photoelectron diffraction"
Type
research article
Web of Science ID
WOS:000229074300073
Author(s)
Date Issued
2005
Published in
Volume
94
Issue
18
Article Number
189601
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
October 8, 2009
Use this identifier to reference this record