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research article

Quantum Mechanical Confinement in the Fin Electron-Hole Bilayer Tunnel Field-Effect Transistor

Padilla, Jose L.
•
Alper, Cem  
•
Gamiz, Francisco
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2016
IEEE Transactions on Electron Devices

Quantum mechanical confinement in electron-hole bilayer tunnel field-effect transistors (EHBTFETs) affects in a substantial way the band-to-band tunneling (BTBT) mechanism that constitutes their operating principle. Field-induced quantization is known to set off effective bandgap widening phenomena-with the subsequent BTBT probability reduction that it entails-and to give rise to harmful parasitic tunneling processes. Both of these effects degrade the potential steep switching behavior of bilayer TFETs. In this paper, we show that the novel FinEHBTFET proves to be a promising structure for its scalability potential and propose a solution to alleviate the impact on it of quantum confinement, as well as to suppress the parasitic tunneling processes that show up when quantization is considered. Moreover, we demonstrate for different fin materials that the utilization of asymmetric configurations delaying the formation of electron inversion layers allows us to boost ION levels.

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Type
research article
DOI
10.1109/Ted.2016.2574893
Web of Science ID

WOS:000380324600050

Author(s)
Padilla, Jose L.
Alper, Cem  
Gamiz, Francisco
Ionescu, Adrian Mihai  
Date Issued

2016

Publisher

Ieee-Inst Electrical Electronics Engineers Inc

Published in
IEEE Transactions on Electron Devices
Volume

63

Issue

8

Start page

3320

End page

3326

Subjects

Asymmetric layouts

•

band-to-band tunneling (BTBT)

•

fin electron-hole bilayer tunnel field-effect transistor (EHBTFET)

•

quantum confinement

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Available on Infoscience
October 18, 2016
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/130419
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