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research article

Reliable Gate Driving of SiC MOSFETs With Crosstalk Voltage Elimination and Two-Step Short-Circuit Protection

Li, Chengmin
•
Sheng, Jing
•
Dujic, Drazen  
2022
IEEE Transactions on Industrial Electronics
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2022_IEEE_TIE_Li.pdf

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http://purl.org/coar/version/c_ab4af688f83e57aa

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