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research article

Dark-field optical coherence microscopy

Villiger, Martin  
•
Pache, Christophe  
•
Lasser, Theo  
2010
Optics Letters

Dark-field illumination is known to enhance scattering contrast in optical microscopy. We combined this concept with Fourier domain optical coherence microscopy (OCM). The detection and illumination paths are decoupled, and only the scattered light originating from the sample generates the tomogram signal, whereas any specular reflection is highly suppressed. We analyze and discuss this dark-field OCM concept and present its superior imaging quality on live cell samples.

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Type
research article
DOI
10.1364/OL.35.003489
Web of Science ID

WOS:000283048100061

Author(s)
Villiger, Martin  
Pache, Christophe  
Lasser, Theo  
Date Issued

2010

Publisher

Optical Society of America

Published in
Optics Letters
Volume

35

Issue

20

Start page

3489

End page

3491

Subjects

Instrumentation, measurement, and metrology : Scattering measurements

•

Medical optics and biotechnology : Cell analysis

•

Microscopy : Coherence tomography

Editorial or Peer reviewed

REVIEWED

Written at

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April 14, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/66415
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