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  4. Characterization of a MEMS-based VIS and near-IR Lamellar Spectrometer
 
conference paper

Characterization of a MEMS-based VIS and near-IR Lamellar Spectrometer

Manzardo, O.
•
Schädelin, F.
•
Herzig, H. P.  
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2004
IEEE/LEOS International Conference on Optical MEMS 2004
  • Details
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Type
conference paper
Author(s)
Manzardo, O.
Schädelin, F.
Herzig, H. P.  
Noell, W.
de Rooij, N. F.  
Date Issued

2004

Published in
IEEE/LEOS International Conference on Optical MEMS 2004
Start page

44

End page

45

Written at

OTHER

EPFL units
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Available on Infoscience
April 22, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/37911
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