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  4. Neutron radiation hardness of single-photon avalanche diodes for future RICH detectors
 
conference paper

Neutron radiation hardness of single-photon avalanche diodes for future RICH detectors

Dolenec, R.
•
Wu, M.-L.
•
Bruschini, Claudio  
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November 4, 2023
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
2023 IEEE Symposium on Nuclear Science (NSS/MIC)

The next generation of experiments in high energy particle physics will require a large increase in interaction density, which presents a challenge for particle detectors. Ring imaging Cherenkov detectors (RICH), planned for future upgrades of the LHCb, Belle II and ALICE 3 experiments, will have to operate at increased channel occupancy and background radiation, and currently no photodetector can fulfill all planned requirements. Analog silicon photomultipliers (SiPMs) would be an attractive photodetector candidate, if only their radiation hardness could be improved. To achieve the targeted radiation tolerance, as well as other RICH detector requirements, dedicated developments and a combination of radiation damage reduction and mitigation techniques are needed. We propose a dedicated digital analog SiPM design, achieving the required radiation hardness by using compensating electronics to adjust the sensor response, together with an optimized single-photon avalanche diode (SPAD) array architecture. In order to guide future SPAD designs, we studied the performance of 180 nm actively recharged CMOS SPADs irradiated with neutron fluxes up to 1012 1-MeV neutron equivalent/cm2. We report on dark count rates and afterpulsing probability before and after irradiation, with results also for room temperature annealing and cooling down to -60°C.

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Type
conference paper
DOI
10.1109/NSSMICRTSD49126.2023.10337871
Author(s)
Dolenec, R.
Wu, M.-L.
Bruschini, Claudio  

EPFL

Charbon, Edoardo  

EPFL

Rodríguez, D. Consuegra
Gramuglia, F.
Križan, P.
Seljak, A.
Pestotnik, R.
Korpar, S.
Date Issued

2023-11-04

Publisher

IEEE

Published in
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
DOI of the book
https://doi.org/10.1109/NSSMICRTSD49126.2023
ISBN of the book

| 979-8-3503-3866-9

Published in
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
Start page

1

End page

1

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
AQUA  
Event nameEvent acronymEvent placeEvent date
2023 IEEE Symposium on Nuclear Science (NSS/MIC)

Vancouver, BC, Canada

2023-11-04 - 2023-11-11

FunderGrant Number

National Science Foundation

Available on Infoscience
May 19, 2025
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/250286
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