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  4. Symmetrically arranged quartz tuning fork with soft cantilever for intermittent contact mode atomic force microscopy
 
research article

Symmetrically arranged quartz tuning fork with soft cantilever for intermittent contact mode atomic force microscopy

Akiyama, T.  
•
Staufer, U.
•
de Rooij, N. F.  
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2003
Review of Scientific Instruments

The dynamic mode atomic force microscopy based on a microfabricated cantilever and a commercial quartz tuning fork was probed. The probe was self-sensing and self-actuating. The tuning fork performed the function of a force sensor. The amplitude and frequency of the tuning fork governed the tip vibration, while the cantilever determined the spring constant.

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  • Metrics
Type
research article
DOI
10.1063/1.1523631
Author(s)
Akiyama, T.  
Staufer, U.
de Rooij, N. F.  
Frederix, P.
Engel, A.
Date Issued

2003

Published in
Review of Scientific Instruments
Volume

74

Issue

1 I

Start page

112

End page

117

Note

296

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/38931
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