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  4. Self-Sharpening Tip Integrated on Micro Cantilevers with Self-Exciting Piezoelectric Sensor for Parallel Atomic Force Microscopy
 
research article

Self-Sharpening Tip Integrated on Micro Cantilevers with Self-Exciting Piezoelectric Sensor for Parallel Atomic Force Microscopy

Indermühle, P.-F.
•
Schürmann, G.
•
Racine, G.-A.
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1997
Applied Physics Letters
  • Details
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Type
research article
DOI
10.1063/1.118817
Author(s)
Indermühle, P.-F.
Schürmann, G.
Racine, G.-A.
de Rooij, N. F.  
Date Issued

1997

Publisher

AIP American Institute of Physics

Published in
Applied Physics Letters
Volume

70

Issue

17

Start page

2318

End page

2320

Note

159

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39430
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