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  4. Tunneling path impact on semi-classical numerical simulations of TFET devices
 
conference paper

Tunneling path impact on semi-classical numerical simulations of TFET devices

De Michielis, Luca  
•
Iellina, Matteo
•
Palestri, Pierpaolo
Show more
2011
Ulis 2011 Ultimate Integration on Silicon
2011 12th International Conference on Ultimate Integration on Silicon (ULIS)

In this work a non-local band-to-band tunnelling model has been implemented into a full-band Monte Carlo simulator. Two different approaches for the choice of the tunnelling path have been implemented and their impact on the transfer characteristics of different Tunnel FET structures is investigated. In both the SOI and the DG TFET architectures we have simulated, up to 1 order of magnitude of underestimation in the current and up to 15% of difference in the value of the Subthreshold Slope can be found according to the choice of the tunnelling path. © 2011 IEEE.

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Type
conference paper
DOI
10.1109/ULIS.2011.5758002
Author(s)
De Michielis, Luca  
•
Iellina, Matteo
•
Palestri, Pierpaolo
•
Ionescu, Adrian M.  
•
Selmi, Luca
Date Issued

2011

Publisher

IEEE

Published in
Ulis 2011 Ultimate Integration on Silicon
Start page

1

End page

4

Subjects

Tunnel FET

•

TFET

•

FP7 STEEPER

•

Nanotera

•

NANOSIL FP7

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Event nameEvent placeEvent date
2011 12th International Conference on Ultimate Integration on Silicon (ULIS)

Cork, Ireland

14-16 03 2011

Available on Infoscience
January 19, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/76769
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