conference paper
Low temperature single electron characteristics in gate-all-around MOSFET
2006
Proceedings of the 36th European Solid-State Devices Research Conference, ESSDERC 2006
Type
conference paper
Web of Science ID
WOS:000245038000102
Author(s)
Date Issued
2006
Published in
Proceedings of the 36th European Solid-State Devices Research Conference, ESSDERC 2006
Start page
427
End page
430
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
May 16, 2007
Use this identifier to reference this record