research article
Wafer- and piece-wise Si tip transfer technologies for applications in scanning probe microscopy
Type
research article
Author(s)
Date Issued
1999
Published in
Volume
8
Issue
1
Start page
65
End page
70
Note
211
Editorial or Peer reviewed
REVIEWED
Written at
OTHER
EPFL units
Available on Infoscience
May 12, 2009
Use this identifier to reference this record