Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Parallel atomic force microscopy using optical heterodyne detection
 
conference paper

Parallel atomic force microscopy using optical heterodyne detection

Chantada, L.  
•
Kim, M.-S.  
•
Manzardo, O.
Show more
2006
MEMS, MOEMS, and Micromachining II
  • Details
  • Metrics
Type
conference paper
DOI
10.1117/12.664452
Author(s)
Chantada, L.  
Kim, M.-S.  
Manzardo, O.
Dändliker, R.  
Aeschimann, L.
Staufer, U.
Vettiger, P.
Weible, K.
Herzig, H. P.  
Date Issued

2006

Published in
MEMS, MOEMS, and Micromachining II
Series title/Series vol.

Proc. SPIE; 6186

Start page

61860B

Written at

OTHER

EPFL units
OPT  
Available on Infoscience
April 22, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/37987
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés