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  4. A 120 dB dynamic-range radiation-tolerant charge-to-digital converter for radiation monitoring
 
research article

A 120 dB dynamic-range radiation-tolerant charge-to-digital converter for radiation monitoring

Venturini, Giuseppe
•
Anghinolfi, Francis
•
Dehning, Bernd
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2013
Microelectronics Journal

We present a radiation-tolerant 120 dB dynamic-range interface circuit for ionization chambers and diamond detectors. The device consists of a multi-scale continuous-time incremental charge-to-digital converter paired with a temperature-compensated current reference. The circuit selects the sensitivity according to the input signal level and provides a 20-bit plus sign output code every 40 mu s. The proposed interface circuit achieves a measurement linearity error better than +/- 5% in the 40 fC-42 nC range. The ASIC has been designed for radiation-tolerance in a 0.25 mu m 3M1P CMOS technology and tested for TID up to 100 kGy(Si), showing uninterrupted functionality. The conversion reference drifts of 3% at 100 kGy(Si) and its temperature coefficient is less than 600 ppm/degrees C. (C) 2013 Elsevier Ltd. All rights reserved.

  • Details
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Type
research article
DOI
10.1016/j.mejo.2013.08.020
Web of Science ID

WOS:000329267500032

Author(s)
Venturini, Giuseppe
Anghinolfi, Francis
Dehning, Bernd
Krummenacher, Francois  
Kayal, Maher  
Date Issued

2013

Publisher

Elsevier

Published in
Microelectronics Journal
Volume

44

Issue

12

Start page

1302

End page

1308

Subjects

VLSI

•

Analog-to-digital converters

•

Analog front end

•

Radiation monitoring

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

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GR-KA  
Available on Infoscience
February 17, 2014
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/100821
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