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  4. Band-to-band tunneling distance analysis in the heterogate electron-hole bilayer tunnel field-effect transistor
 
research article

Band-to-band tunneling distance analysis in the heterogate electron-hole bilayer tunnel field-effect transistor

Padilla, J. L.
•
Palomares, A.
•
Alper, C.
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2016
Journal Of Applied Physics

In this work, we analyze the behavior of the band-to-band tunneling distance between electron and hole subbands resulting from field-induced quantum confinement in the heterogate electron-hole bilayer tunnel field-effect transistor. We show that, analogously to the explicit formula for the tunneling distance that can be easily obtained in the semiclassical framework where the conduction and valence band edges are allowed states, an equivalent analytical expression can be derived in the presence of field-induced quantum confinement for describing the dependence of the tunneling distance on the body thickness and material properties of the channel. This explicit expression accounting for quantum confinement holds valid provided that the potential wells for electrons and holes at the top and bottom of the channel can be approximated by triangular profiles. Analytical predictions are compared to simulation results showing very accurate agreement. (C) 2016 AIP Publishing LLC.

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Type
research article
DOI
10.1063/1.4940741
Web of Science ID

WOS:000369896300048

Author(s)
Padilla, J. L.
Palomares, A.
Alper, C.
Gamiz, F.
Ionescu, A. M.  
Date Issued

2016

Publisher

Amer Inst Physics

Published in
Journal Of Applied Physics
Volume

119

Issue

4

Article Number

045705

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Available on Infoscience
April 1, 2016
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/125420
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