Measurement of In-Grain Orientation Gradients by EBSD and Comparison with Finite Element Results
The characterization of In-grain orientation gradients by electron backscattering diffraction (EBSD) technique was studied. The study, based on finite element (FE) technique, involved the simulation of plane strain compression of the crystal grains. In regard to it, the construction of orientation distribution function (ODF) by superimposing spherical Gaussian distributions on the mean orientation of grains was also discussed.
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Delannay, L., Logé, R. E., Chastel, Y., Signorelli, J. W., & Van Houtte, P. (2003). Measurement of In-Grain Orientation Gradients by EBSD and Comparison with Finite Element Results. Advanced Engineering Materials, 5, 597–600. https://doi.org/10.1002/adem.200300376
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2003
5
597
600
REVIEWED
OTHER