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research article

High aspect ratio UV photolithography for electroplated structures

Roth, S.
•
Dellmann, L.
•
Racine, G.-A.
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1999
Journal of Micromechanics and Microengineering

This paper describes single and two layer processes to realize thick resist moulds (40 and 80 μm) with a good reproducibility. The patterning of a thick AZ 4562 photoresist layer is performed with standard photolithography equipment. Different problems related to thick photoresist patterning (edge bead, resist cracking,...) are discussed and solutions are proposed. Side walls are characterized after nickel electrodeposition and mould dissolution in acetone. Results, process limitations and applications are presented.

  • Details
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Type
research article
DOI
10.1088/0960-1317/9/2/001
Author(s)
Roth, S.
Dellmann, L.
Racine, G.-A.
de Rooij, N. F.  
Date Issued

1999

Published in
Journal of Micromechanics and Microengineering
Volume

9

Start page

105

End page

108

Note

200

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39810
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