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  4. Microlenses metrology with digital holographic microscopy
 
conference paper

Microlenses metrology with digital holographic microscopy

Charrière, F.  
•
Kühn, J.
•
Colomb, T.  
Show more
2005
Optical Measurement Systems for Industrial Inspection IV
Europe Optical Metrology

Digital holographic Microscopy (DHM) is an imaging modality reconstructing the wavefront in a numerical form, directly from a single digitalized hologram. It brings quantitative data derived simultaneously from the amplitude and phase of the complex reconstructed wavefront diffracted by the object and it is used to determine the refractive index and/or shape of the object with accuracy in the nanometer range along the optical axis. DHM comprises a microscope objective to adapt the sampling capacity of the camera to the information content of the hologram. This paper illustrates some of the possibilities offered by DHM for micro-optics quality control. Actual results obtained by DHM, yielding an axial precision up to 3.7 nm, will be compared with measurements performed with interferometers by SUSS MicroOptics SA and with the profiles measured with a mechanical scanning probe instrument (Alpha step 200 from Tencor Instrument). Two different micro-lenses arrays where tested: a quartz refractive lenses array (observed with transmission DHM) and a Silicon refractive lens array (observed with reflection DHM). Switzerland.

  • Details
  • Metrics
Type
conference paper
DOI
10.1117/12.612600
Web of Science ID

WOS:000231416400052

Author(s)
Charrière, F.  
Kühn, J.
Colomb, T.  
Montfort, F.  
Cuche, E.  
Emery, Y.
Weible, K.
Depeursinge, C. D.  
Date Issued

2005

Publisher

SPIE

Published in
Optical Measurement Systems for Industrial Inspection IV
Volume

5856

Start page

447

End page

453

Subjects

[MVD]

•

holography

•

microscopy

•

phase-contrast

•

micro-optics

URL

URL

http://spie.org/x648.html?product_id=612600
Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LOA  
Event nameEvent placeEvent date
Europe Optical Metrology

Munich

June 13-17, 2005

Available on Infoscience
July 20, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/41565
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