conference paper
Scanning Probe with Tuning Fork Sensor, Microfabricated Silicon Cantilever and Conductive Tip for Microscopy at Cryogenic Temperature
2005
13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques STM2005
Type
conference paper
Author(s)
Date Issued
2005
Published in
13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques STM2005
Editorial or Peer reviewed
NON-REVIEWED
Written at
OTHER
EPFL units
Available on Infoscience
May 12, 2009
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