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  4. Investigation of oxidation-induced strain in a top-down Si nanowire platform
 
conference paper

Investigation of oxidation-induced strain in a top-down Si nanowire platform

Najmzadeh, Mohammad  
•
Bouvet, Didier  
•
Dobrosz, Peter
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2009
the 16th biennial conference on Insulating Films on Semiconductors
INFOS 2009 (biennial)
  • Details
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Type
conference paper
Author(s)
Najmzadeh, Mohammad  
Bouvet, Didier  
Dobrosz, Peter
Sarah, Olsen
Ionescu, Mihai Adrian  
Date Issued

2009

Published in
the 16th biennial conference on Insulating Films on Semiconductors
Subjects

Si nanowire

•

Oxidation-induced strain

•

Micro-Raman spectroscopy

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Event nameEvent placeEvent date
INFOS 2009 (biennial)

Cambridge, the UK

28 June-1 July 2009

Available on Infoscience
March 1, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/78238
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