Spatial and temporal light modulation is a well-established technology that enables dynamic shaping of the phase and amplitude of optical fields, significantly enhancing the resolution and sensitivity of imaging methods. Translating this capability to electron beams is highly desirable within the framework of a transmission electron microscope (TEM) to benefit from the nanometer spatial resolution of this instrument. In this work, we report on the experimental realization of a photonic-based free-electron modulator integrated into the column of two ultrafast TEMs for presample electron-beam shaping. Electron-photon interaction is employed to coherently modulate both the transverse and longitudinal components of the electron wave function (through lateral phase imprinting and temporal profiling, respectively), while leveraging dynamically controlled optical fields and tailored designs of the electron-laser-sample interaction geometry. Using energyand momentum-resolved electron detection, we successfully reconstruct the shaped electron wave function at the TEM sample plane. These results demonstrate the ability to manipulate the electron wave function before probing the sample, paving the way for photonics-inspired imaging and spectroscopy techniques in ultrafast electron microscopy.