research article
Growth mechanisms and near-interface structure in relation to orientation of MoS2 sputtered thin films
Cite this item
Moser, J., & Lévy, F. (1992). Growth mechanisms and near-interface structure in relation to orientation of MoS2 sputtered thin films. Journal of Materials Research, 7(3), 734–740. https://doi.org/10.1557/JMR.1992.0734
Click Copy to copy the citation, or select the text manually.
Loading...
Name
S0884291400015958.pdf
Type
Publisher's Version
Version
Published version
Access type
openaccess
Size
2.6 MB
Format
Adobe PDF
Checksum (MD5)
ea5f927631a2505cc00b57ede64da032