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  4. AAM: An Assessment Metric of Axial Chromatic Aberration
 
conference paper

AAM: An Assessment Metric of Axial Chromatic Aberration

El Helou, Majed  
•
Dümbgen, Frederike  
•
Süsstrunk, Sabine  
2018
2018 25th IEEE International Conference on Image Processing (ICIP)
IEEE International Conference on Image Processing (ICIP)

Knowledge of lens specifications is important to identify the best lens for a given capture scenario and application. Lens manufacturers provide many specifications in their data sheets, and multiple initiatives for testing and comparing different lenses can be found online. However, due to the lack of a suitable metric or technique, no evaluation of axial chromatic aberration is available. In this paper, we propose a metric, Axial Aberration Magnitude or AAM, that assesses the degree of axial chromatic aberration of a given lens. Our metric is generalizable to multispectral acquisition systems and is very simple and cheap to compute. We present the entire procedure and algorithm for computing the AAM metric, and evaluate it for two spectral systems and two consumer lenses.

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Type
conference paper
DOI
10.1109/ICIP.2018.8451377
Author(s)
El Helou, Majed  
Dümbgen, Frederike  
Süsstrunk, Sabine  
Date Issued

2018

Published in
2018 25th IEEE International Conference on Image Processing (ICIP)
Total of pages

5

Start page

2486

End page

2490

Subjects

Axial chromatic aberration

•

Lens assessment metric

•

Chromatic aberration blur

URL

Implementation Codes

https://github.com/duembgen/aam_icip18
Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
IVRL  
LCAV  
Event name
IEEE International Conference on Image Processing (ICIP)
RelationURL/DOI

IsSupplementedBy

https://github.com/duembgen/aam_icip18
Available on Infoscience
May 28, 2018
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/146656
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