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research article

Wavelet Statistics of Sparse and Self-Similar Images

Fageot, Julien  
•
Bostan, Emrah  
•
Unser, Michael  
2015
Siam Journal On Imaging Sciences

It is well documented that natural images are compressible in wavelet bases and tend to exhibit fractal properties. In this paper, we investigate statistical models that mimic these behaviors. We then use our models to make predictions on the statistics of the wavelet coefficients. Following an innovation modeling approach, we identify a general class of finite-variance self-similar sparse random processes. We first prove that spatially dilated versions of self-similar sparse processes are asymptotically Gaussian as the dilation factor increases. Based on this fundamental result, we show that the coarse-scale wavelet coefficients of these processes are also asymptotically Gaussian, provided the wavelet has enough vanishing moments. Moreover, we quantify the degree of Gaussianity by deriving the theoretical evolution of the kurtosis of the wavelet coefficients across scales. Finally, we apply our analysis to one- and two-dimensional signals, including natural images, and show that the wavelet coefficients tend to become Gaussian at coarse scales.

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Type
research article
DOI
10.1137/151003015
Web of Science ID

WOS:000367019300024

Author(s)
Fageot, Julien  
Bostan, Emrah  
Unser, Michael  
Date Issued

2015

Publisher

Siam Publications

Published in
Siam Journal On Imaging Sciences
Volume

8

Issue

4

Start page

2951

End page

2975

Subjects

wavelet statistics

•

wide-sense self-similar processes

•

sparse processes

•

central-limit theorem

•

innovation model

URL

URL

http://bigwww.epfl.ch/publications/fageot1502.html

URL

http://bigwww.epfl.ch/publications/fageot1502.pdf

URL

http://bigwww.epfl.ch/publications/fageot1502.ps
Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LIB  
Available on Infoscience
February 16, 2016
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/123619
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