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  4. Contrast analysis in TEM images of InGaAs/GaAs strained layers grown on non-planar substrates
 
conference paper

Contrast analysis in TEM images of InGaAs/GaAs strained layers grown on non-planar substrates

Condo, A
•
Leifer, K  
•
Rudra, A  
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1999
Microscopy of Semiconducting Materials. Proc.
  • Details
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Type
conference paper
Web of Science ID

WOS:000166835300039

Author(s)
Condo, A
Leifer, K  
Rudra, A  
Michler, J
Blank, E
Kapon, E
Date Issued

1999

Publisher

IOP Publishing LTD

Published in
Microscopy of Semiconducting Materials. Proc.
Series title/Series vol.

Institute of Physics Conference Series

Volume

164

Start page

185

End page

188

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2982
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