A novel imaging technique is proposed for fully digital detection of phase and intensity of light. A fully integrated camera implementing the new technique was fabricated in a 0.35μm CMOS technology. When coupled to a modulated light source, the camera can be used to accurately and rapidly reconstruct a 3D scene by evaluating the time-of-flight of the light reflected by a target. In passive mode, it allows building differential phase maps of reflection patterns for image enhancement purposes. Tests show the suitability of the technique and confirm phase accuracy predictions.