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  4. Compact Modeling of Suspended Gate FET
 
conference paper

Compact Modeling of Suspended Gate FET

Chauhan, Y. S.  
•
Tsamados, D.
•
Abele, N.  
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2008
VLSI Design, 2008. VLSID 2008. 21st International Conference on

For the first time, a compact model for suspended gate (SG) FET valid for entire bias range is proposed. The model is capable of simulating both pull-in and pull-out effects, which are the two important phenomena of this device. A novel hybrid numerical simulation approach combining ANSYS Multiphysics and ISE-DESSIS in a self-consistent system is developed. The model is then validated on this numerical device simulation of SGFET. The model shows excellent performance over the entire drain and gate voltage range. The model has been implemented in Verilog-A code and tested on ELDO and Spectre simulators, which makes it useful for circuit simulations using SGFET devices.

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Type
conference paper
DOI
10.1109/VLSI.2008.11
Web of Science ID

WOS:000253939700026

Author(s)
Chauhan, Y. S.  
Tsamados, D.
Abele, N.  
Eggimann, C.
Declercq, M.  
Ionescu, A. M.  
Date Issued

2008

Published in
VLSI Design, 2008. VLSID 2008. 21st International Conference on
Start page

119

End page

124

Subjects

field effect transistors

•

hardware description languages

•

semiconductor device models

•

ELDO simulators

•

ISE-DESSIS

•

SG FET

•

SGFET devices

•

Spectre simulators

•

Verilog-A code

•

hybrid numerical simulation approach ANSYS Multiphysics

•

pull-in effects

•

pull-out effects

•

self-consistent system

•

suspended gate FET

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Available on Infoscience
July 15, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/41323
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