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  4. Charge-Based Modeling of Long-Channel Symmetric Double-Gate Junction FETs—Part I: Drain Current and Transconductances
 
research article

Charge-Based Modeling of Long-Channel Symmetric Double-Gate Junction FETs—Part I: Drain Current and Transconductances

Markis, Nikolaos
•
Jazaeri, Farzan
•
Sallese, Jean-Michel  
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2018
IEEE Transactions on Electron Devices
  • Details
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Type
research article
DOI
10.1109/TED.2018.2838101
Web of Science ID

WOS:000435546700010

Author(s)
Markis, Nikolaos
Jazaeri, Farzan
Sallese, Jean-Michel  
Sharma, Rupendra Kumar
Bucher, Matthias
Date Issued

2018

Published in
IEEE Transactions on Electron Devices
Volume

65

Issue

7

Start page

2744

End page

2750

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
EDLAB  
Available on Infoscience
October 25, 2017
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/141604
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