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research article

Three-dimensional super-resolution structured illumination microscopy with maximum a posteriori probability image estimation

Lukes, Tomas  
•
Krizek, Pavel
•
Svindrych, Zdenek
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2014
Optics Express

We introduce and demonstrate a new high performance image reconstruction method for super-resolution structured illumination microscopy based on maximum a posteriori probability estimation (MAP-SIM). Imaging performance is demonstrated on a variety of fluorescent samples of different thickness, labeling density and noise levels. The method provides good suppression of out of focus light, improves spatial resolution, and allows reconstruction of both 2D and 3D images of cells even in the case of weak signals. The method can be used to process both optical sectioning and super-resolution structured illumination microscopy data to create high quality super-resolution images. (C) 2014 Optical Society of America

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Type
research article
DOI
10.1364/Oe.22.029805
Web of Science ID

WOS:000345770500048

Author(s)
Lukes, Tomas  
•
Krizek, Pavel
•
Svindrych, Zdenek
•
Benda, Jakub
•
Ovesny, Martin
•
Fliegel, Karel
•
Klima, Milos
•
Hagen, Guy M.
Date Issued

2014

Publisher

Optical Society of America

Published in
Optics Express
Volume

22

Issue

24

Start page

29805

End page

29817

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LOB  
Available on Infoscience
February 20, 2015
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/111531
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