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  4. Growth, Properties, and Applications of Al1-xScxN Thin Films
 
conference paper

Growth, Properties, and Applications of Al1-xScxN Thin Films

Muralt, Paul  
•
Pashchenko, Vladimir
•
Parsapour, Fazel  
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January 1, 2019
2019 IEEE International Ultrasonics Symposium (Ius)
IEEE International Ultrasonics Symposium (IUS)

The discovery of enhanced piezoelectricity in solid solutions of AlN and ScN is certainly one of the most important events in piezoelectric MEMS. As compared to pure AlN, it brought a crucial factor 2 to 3 improvement in a number of figures of merit governing the performance of MEMS devices. The aim of this contribution is to give a short overview on actual topics in processing, properties, and applications in RF filters and sensors.

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Type
conference paper
DOI
10.1109/ULTSYM.2019.8926081
Web of Science ID

WOS:000510220100066

Author(s)
Muralt, Paul  
Pashchenko, Vladimir
Parsapour, Fazel  
Mertin, Stefan  
Heinz, Bernd
Nicolay, Pascal
Date Issued

2019-01-01

Publisher

IEEE

Publisher place

New York

Published in
2019 IEEE International Ultrasonics Symposium (Ius)
ISBN of the book

978-1-7281-4596-9

Series title/Series vol.

IEEE International Ultrasonics Symposium

Start page

255

End page

257

Subjects

piezoelectric

•

thin film

•

aln-scn

•

radio frequency

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LC  
CIME  
Event nameEvent placeEvent date
IEEE International Ultrasonics Symposium (IUS)

Glasgow, UK

October 06-09, 2019

Available on Infoscience
March 5, 2020
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/166992
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