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conference paper

Better Patch Stitching for Parametric Surface Reconstruction

Deng, Zhantao
•
Bednarik, Jan  
•
Salzmann, Mathieu  
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January 1, 2020
2020 International Conference On 3D Vision (3Dv 2020)
8th International Conference on 3D Vision (3DV)

Recently, parametric mappings have emerged as highly effective surface representations, yielding low reconstruction error. In particular, the latest works represent the target shape as an atlas of multiple mappings, which can closely encode object parts. Atlas representations, however, suffer from one major drawback: The individual mappings are not guaranteed to be consistent, which results in holes in the reconstructed shape or in jagged surface areas.

We introduce an approach that explicitly encourages global consistency of the local mappings. To this end, we introduce two novel loss terms. The first term exploits the surface normals and requires that they remain locally consistent when estimated within and across the individual mappings. The second term further encourages better spatial configuration of the mappings by minimizing novel stitching error. We show on standard benchmarks that the use of normal consistency requirement outperforms the baselines quantitatively while enforcing better stitching leads to much better visual quality of the reconstructed objects as compared to the state-of-the-art.

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Type
conference paper
DOI
10.1109/3DV50981.2020.00069
Web of Science ID

WOS:000653085200060

Author(s)
Deng, Zhantao
Bednarik, Jan  
Salzmann, Mathieu  
Fua, Pascal  
Date Issued

2020-01-01

Publisher

IEEE

Publisher place

New York

Published in
2020 International Conference On 3D Vision (3Dv 2020)
ISBN of the book

978-1-7281-8128-8

Series title/Series vol.

International Conference on 3D Vision

Start page

593

End page

602

Subjects

Engineering, Electrical & Electronic

•

Engineering

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CVLAB  
Event nameEvent placeEvent date
8th International Conference on 3D Vision (3DV)

ELECTR NETWORK

Nov 25-28, 2020

Available on Infoscience
July 3, 2021
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/179589
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