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research article

Patch-wise denoising of phase fringe patterns based on matrix enhancement

Kulkarni, Rishikesh Dilip  
•
Rastogi, Pramod  
2016
Optics and Lasers in Engineering

We propose a new approach for the denoising of a phase fringe pattern recorded in an optical interferometric setup. The phase fringe pattern which is generally corrupted by high amount of speckle noise is first converted into an exponential phase field. This phase field is divided into a number of overlapping patches. Owing to the small size of each patch, the presence of a simple structure of the interference phase is assumed in it. Accordingly, the singular value decomposition (SVD) of the patch allows us to separate the signal and noise components effectively. The patch is reconstructed only with the signal component. In order to further improve the robustness of the proposed method, an enhanced data matrix is generated using the patch and the SVD of this enhanced matrix is computed. The matrix enhancement results in an increased dimension of the noise subspace which thus accommodates more amount of noise component. Reassignment of the filtered pixels of the preceding patch in the current patch improves the noise filtering accuracy. The fringe denoising capability in function of the noise level and the patch size is studied. Simulation and experimental results are provided to demonstrate the practical applicability of the proposed method. (C) 2016 Elsevier Ltd. All rights reserved.

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Type
research article
DOI
10.1016/j.optlaseng.2016.04.025
Web of Science ID

WOS:000384790800019

Author(s)
Kulkarni, Rishikesh Dilip  
Rastogi, Pramod  
Date Issued

2016

Published in
Optics and Lasers in Engineering
Volume

87

Start page

191

End page

196

Subjects

Phase fringe pattern

•

Exponential phase field

•

Enhanced matrix

•

Singular value decomposition

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
IMAC  
GIS-GE  
Available on Infoscience
October 26, 2016
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/130777
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