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research article

Thin-layer black phosphorous/GaAs heterojunction p-n diodes

Gehring, Pascal
•
Urcuyo, Roberto
•
Duong, Dinh Loc
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2015
Applied Physics Letters

Owing to its high carrier mobility and thickness-tunable direct band gap, black phosphorous emerges as a promising component of optoelectronic devices. Here, we evaluate the device characteristics of p-n heterojunction diodes wherein thin black phosphorous layers are interfaced with an underlying, highly n-doped GaAs substrate. The p-n heterojunctions exhibit close-to-ideal diode behavior at low bias, while under illumination they display a photoresponse that is evenly distributed over the entire junction area, with an external quantum efficiency of up to 10% at zero bias. Moreover, the observed maximum open circuit voltage of 0.6 V is consistent with the band gap estimated for a black phosphorous sheet with a thickness on the order of 10 nm. Further analysis reveals that the device performance is limited by the structural quality of the black phosphorous surface. (C) 2015 AIP Publishing LLC.

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Type
research article
DOI
10.1063/1.4922531
Web of Science ID

WOS:000356170900042

Author(s)
Gehring, Pascal
Urcuyo, Roberto
Duong, Dinh Loc
Burghard, Marko  
Kern, Klaus  
Date Issued

2015

Publisher

Amer Inst Physics

Published in
Applied Physics Letters
Volume

106

Issue

23

Article Number

233110

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSEN  
Available on Infoscience
September 28, 2015
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/119276
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