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  4. Impact of Data Serialization over TSVs on Routing Congestion in 3D-Stacked Multi-Core Processors
 
research article

Impact of Data Serialization over TSVs on Routing Congestion in 3D-Stacked Multi-Core Processors

Beanato, Giulia  
•
Cevrero, Alessandro  
•
De Micheli, Giovanni  
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2016
Microelectronics Journal

3D integration can alleviate routing congestion, reducing the wirelength and improving performances. Nevertheless, each TSV still occupies non-negligible silicon area: as the number of TSV increases, their effect on the chip routing is detrimental. The reduction in the number of 3D vias obtained with the adoption of serial vertical connections can relieve the routing congestion of the 3D system by reducing the average wirelength. In this paper we explore the impact of the serial approach on the chip routing of a 3D multi processor platform to quantify the achievable wirelength reduction for a range of TSV technologies. The comparison between the serial and the parallel multi-processor configurations shows up to 12.4% wirelength improvement for the serial solution, with serious consequences on routing delay.

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Type
research article
DOI
10.1016/j.mejo.2015.12.004
Web of Science ID

WOS:000375044300004

Author(s)
Beanato, Giulia  
Cevrero, Alessandro  
De Micheli, Giovanni  
Leblebici, Yusuf  
Date Issued

2016

Publisher

Elsevier

Published in
Microelectronics Journal
Volume

51

Issue

May

Start page

38

End page

45

Subjects

3D integrated circuits

•

through silicon vias (TSV)

•

CMP

•

high speed serial link

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSM  
LSI1  
Available on Infoscience
February 11, 2016
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/123406
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