In this article we present a method to achieve tri-dimensional contouring of macroscopic objects. A modified reference wave speckle interferometer is used in conjunction with a source of reduced coherence. The depth signal is given by the envelope of the interference signal, directly determined by the coherence length of the source. Fringes are detected in the interferogram obtained by a single shot and are detected by means of adequate filtering. With the approach based on off-axis configuration, a contour line can be extracted from a single acquisition, thus allowing to use the system in harsh environment.