Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. One-Dimensional "Ghost Imaging" in Electron Microscopy of Inelastically Scattered Electrons
 
research article

One-Dimensional "Ghost Imaging" in Electron Microscopy of Inelastically Scattered Electrons

Rotunno, Enzo
•
Gargiulo, Simone  
•
Vanacore, Giovanni M.  
Show more
June 5, 2023
Acs Photonics

Entanglement and correlation are at the basis of quantummechanicsand have been used in optics to create a framework for "ghostimaging". We propose that a similar scheme can be used in anelectron microscope to exploit the correlation of electrons with thecoincident detection of collective mode excitations in a sample. Inthis way, an image of the sample can be formed on an electron cameraeven if electrons never illuminated the region of interest directly.This concept, which can be regarded as the inverse of photon-inducednear-field electron microscopy, can be used to probe delicate moleculeswith a resolution that is beyond the wavelength of the collectivemode.

  • Files
  • Details
  • Metrics
Loading...
Thumbnail Image
Name

2106.08955.pdf

Type

Preprint

Version

Submitted version (Preprint)

Access type

openaccess

License Condition

n/a

Size

1.53 MB

Format

Adobe PDF

Checksum (MD5)

7c2c6aa3350162240016bd8452e46c1f

Loading...
Thumbnail Image
Name

acsphotonics.2c01925.pdf

Type

Publisher

Version

Published version

Access type

openaccess

License Condition

CC BY

Size

4.31 MB

Format

Adobe PDF

Checksum (MD5)

49238cd0ff082b68d33d59edae966459

Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés