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  4. Piezoresistive Ni:a-C:H thin films containing hcp-Ni or Ni3C investigated by XRD, EXAFS, and wavelet analysis
 
research article

Piezoresistive Ni:a-C:H thin films containing hcp-Ni or Ni3C investigated by XRD, EXAFS, and wavelet analysis

Uhlig, Steffen
•
Struis, Rudolf
•
Schmid-Engel, Hanna
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2013
Diamond and Related Materials
  • Details
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Type
research article
DOI
10.1016/j.diamond.2013.01.013
Author(s)
Uhlig, Steffen
Struis, Rudolf
Schmid-Engel, Hanna
Bock, Jochen
Probst, Anne-Catherine
Freitag-Weber, Olivia
Zizak, Ivo
Chernikov, Roman
Schultes, Günter
Date Issued

2013

Publisher

Elsevier

Published in
Diamond and Related Materials
Volume

34

Start page

25

End page

35

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
GR-LUD  
Available on Infoscience
July 20, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/93427
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