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  4. Breaking one into three: Surface-tension-driven droplet breakup in T-junctions
 
research article

Breaking one into three: Surface-tension-driven droplet breakup in T-junctions

Zhou, Jiande  
•
Ducimetiere, Yves-Marie  
•
Migliozzi, Daniel  
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May 16, 2023
Physical Review Fluids

Droplet breakup is an important phenomenon in the field of microfluidics to generate daughter droplets. In this work, a novel breakup regime in the widely studied T-junction geometry is reported, where the pinch-off occurs laterally in the two outlet channels, leading to the formation of three daughter droplets, rather than at the center of the junction for conventional T-junctions which leads to two daughter droplets. It is demonstrated that this new mechanism is driven by surface tension, and a design rule for the T-junction geometry is proposed. A model for low values of the capillary number Ca is developed to predict the formation and growth of an underlying carrier fluid pocket that accounts for this lateral breakup mechanism. At higher values of Ca, the conventional regime of central breakup becomes dominant again. The competition between the new and the conventional regime is explored. Altogether, this novel droplet formation method at T-junction provides the functionality of alternating droplet size and composition, which can be important for the design of new microfluidic tools.

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Type
research article
DOI
10.1103/PhysRevFluids.8.054201
Web of Science ID

WOS:000995777400002

Author(s)
Zhou, Jiande  
Ducimetiere, Yves-Marie  
Migliozzi, Daniel  
Keiser, Ludovic  
Bertsch, Arnaud  
Gallaire, Francois  
Renaud, Philippe  
Date Issued

2023-05-16

Publisher

AMER PHYSICAL SOC

Published in
Physical Review Fluids
Volume

8

Issue

5

Article Number

054201

Subjects

Physics, Fluids & Plasmas

•

Physics

•

dynamics

•

microfluidics

•

bubbles

•

liquid

•

volume

•

flow

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

Available on Infoscience
June 19, 2023
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/198393
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